Fig. 2: Non-demolition readout of charge state and ionization rate of NIR light.
From: High-fidelity single-shot readout of single electron spin in diamond with spin-to-charge conversion
a Pulse sequence for the charge readout fidelity evaluation. A 3 μs pulse of 532 nm laser reset the population of NV− to be 78%, according the results in (b) and (c). Both of the two charge readings use an integration window of 500 μs. b The correlation between the two consecutive charge readouts. A total of 10,000 tests are performed. Among them there are 7771 cases of (NV−, NV−), 6 cases of (NV−, NV0), 2223 cases of (NV0, NV0), and 0 cases of (NV0, NV−). The orange circles mark the cases with anti-correlation. The charge state is judged to be NV0 when the collected photon number ≤11. The dashed gray lines mark the threshold (the same for c). c The photon number distribution of NV0 and NV−. The charge readout fidelity Fcharge = 99.96%. d The lifetime of the charge state of NV− under Ey + E1,2 (6 + 5 nW) illumination, 400.7 ± 9.7 ms. e Pulse sequence for measuring the ionization rate under simultaneous illumination of Ey and NIR light. f The ionization curves of NV− at different powers of 1064 nm. The solid lines are simulations based on different ionization rates. g The dependence of the NIR ionization rate on its power. The solid line is a linear fit to the data points, with a coefficient of 67.0 ± 6.7 kHz/mW. The three arrows correspond to the three ionization curves shown in (f).
