Fig. 4: TEM characterization of as-grown tBLG.
From: Hetero-site nucleation for growing twisted bilayer graphene with a wide range of twist angles
a Typical SAED pattern of tBLG with a twist angle of ~9°. b Intensity profiles, along the axes marked in (a) with red and blue dashed lines. c Statistical results of stacking order (AB stacking or non-AB stacking) and distribution of twist angles based on SAED patterns of as-grown bilayer graphene domains. d–g HR-TEM images of tBLG with clear Moiré patterns. Insets: Fast Fourier transforms (FFTs) of the corresponding HR-TEM images; scale bars: 5 nm−1.
