Fig. 4: XAS and XMCD characterization of CrTe2 films with thickness of monolayer. | Nature Communications

Fig. 4: XAS and XMCD characterization of CrTe2 films with thickness of monolayer.

From: Room-temperature intrinsic ferromagnetism in epitaxial CrTe2 ultrathin films

Fig. 4

a Typical pairs of XAS and XMCD spectra of 1 ML CrTe2 thin film at various temperatures, where the dichroism at Cr L3 edge is observable up to 200 K. b The partially enlarged XAS spectra near the Cr L3 edge, where the difference between left- and right-circularly polarized XAS is evident. c XMCD percentage as a function of temperature derived from a. The error bars indicate the uncertainties in the background estimation for the XMCD percentage calculation. d Compiled thickness–temperature phase diagram with the TC obtained from XMCD and SQUID measurements. The error bars are the uncertainties in determining the TC.

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