Fig. 1: Schematic of high-temperature superconducting magnet, second generation high-temperature superconducting tape and testing device.
From: Probing of the internal damage morphology in multilayered high-temperature superconducting wires
a Schematic of a pan-cake coil constructed by the coated conductors, the electromagnetic force in the radial direction causes a hoop tensile stress along the tape length. b The sample has a multi-layer structure, consisting of a Hastelloy-C276 substrate of with a thickness of 50 μm, a buffer layer of 1 μm, YBa2Cu3O7−δ (YBCO) layer of 1 μm, and Ag layer of 2 μm on both sides of the tape. c Schematic of the testing system, including a magneto-optical (MO) imaging microscope and cryogenic tensile loading device.
