Fig. 3: Device characterization and carrier dynamics under illumination. | Nature Communications

Fig. 3: Device characterization and carrier dynamics under illumination.

From: Enhanced responsivity and detectivity of fast WSe2 phototransistor using electrostatically tunable in-plane lateral p-n homojunction

Fig. 3

a Iph under light (532 nm laser) vs VMG, with VSG changing from −2 to 2 V. An increase in Iph is observed due to charge separation at the lateral p–n junction leading to an inflow of holes into the MG channel. b Band diagrams across SG-MG-SG showing efficient (holes towards the channel and electrons towards the SG regions) photogenerated e-h separation at the diode depletion regions, going from p+S–pM–p+S to nS–pM–nS configuration. c Responsivity calculated from Iph shows a 24x increase (for fixed VMG = −0.5 V and VD = 1 V) in going from p+S–pM–p+S to nS–pM–nS configuration along the SG-MG-SG direction. d Iph against input optical power shows a sublinear dependency for VSG = −2 and 2 V and without VSG indicating the presence of trap states in the WSe2 channel.

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