Fig. 4: Avalanche statistics of simulated and experimental networks.
From: Avalanches and edge-of-chaos learning in neuromorphic nanowire networks

Top row—probability distributions of avalanche size S (a) and life-time T (b) and plot of average size as function of life-time (c) for simulated networks. Bottom row—probability distributions of avalanche size S (d) and life-time T (e) and plot of average size as function of life-time (f) for experimental networks. Statistics are produced from simulations on an ensemble of 1000 independently generated networks stimulated at V* = 1. Simulations used networks with 2250 nanowires and 6800–7100 junctions (size 150 × 150 μm2 and density 0.10 nw (μm)−2). Experiments are at the same density and have size 500 × 500 μm2. Maximum likelihood power-law fits are indicated.