Fig. 3: ILG-induced ion migration in SAF structures.
From: Ionitronic manipulation of current-induced domain wall motion in synthetic antiferromagnets
X-ray photoelectron spectra (XPS) of a Co-2p, b Ni-2p for SAF samples gated at various VG applied in the following sequence: 0 V (pristine state), +4 V, +4 V → −3 V, and +4 V → −3 V → +4 V.
