Fig. 2: Structural characterizations of Ti3C2Tx.

a 1D and 2D synchrotron X-ray (λ = 0.072916 nm) diffraction (SXRD) patterns and Rietveld refinement of Ti3C2Tx prepared by etching at 700 °C for 10 min. The red arrows in the 2D pattern point to the diffraction peaks of the sample holder; b, c SEM images of Ti3C2Tx with scale bars of b 2 µm and c 0.2 µm.