Fig. 3: Atomic structural analysis of Ti3C2Tx MXene prepared by 10 mins of etching at 700 °C.

High-resolution transmission electron microscopy images at a scale of a 100 nm and b 10 nm, where the inset shows the fast Fourier transform (FFT) pattern of the selected region, with a scale bar of 1/10 nm. Atomic-resolution high-angle annular dark-field (HAADF) images along with the c [\(11{\bar 2}0\)] and d [\(1{\bar 1}00\)] projections and the corresponding crystal structures; insets are enlarged views of the atomic positions. e Atomic-scale EDS mapping along the [\(1{\bar 1}00\)] projection.