Fig. 2: GISAXS and GTSAXS of fullerene-based BHJ.
From: Uncovering the out-of-plane nanomorphology of organic photovoltaic bulk heterojunction by GTSAXS
a The 2D-scattering pattern of P3HT:PC71BM thin film measured at an incidence angle of 0.15o. The orange lines highlight the positions to perform the intensity linecuts. The cyan dotted line illustrates the position of the surface horizon. The b IP and c OOP intensity profiles were extracted in the GISAXS region (black) and in the GTSAXS region (red). The inset of b shows the chemical structure of P3HT and PC71BM.
