Fig. 5: Boxplots of ToF-SIMS surface analysis. | Nature Communications

Fig. 5: Boxplots of ToF-SIMS surface analysis.

From: A mechanistic investigation of the Li10GeP2S12|LiNi1-x-yCoxMnyO2 interface stability in all-solid-state lithium batteries

Fig. 5

Comparison of the normalized intensities of a S2/S3/S4 and b PO3/SO3/NiS fragments at the surface of cathodes with different SOCs. The intensities of S2/S3/S4 signals were normalized with the total ion intensity, and the intensities of PO3/SO3/NiS fragments were normalized in relation to the NiO2 signal. The lines in boxes depict the median, lower and upper box limits indicate 25th and 75th percentiles, respectively. Whiskers extend to ±1.5 × IQR, and points are outliers.

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