Fig. 2: Analysis of the origin of dark current. | Nature Communications

Fig. 2: Analysis of the origin of dark current.

From: Ultralow dark current in near-infrared perovskite photodiodes by reducing charge injection and interfacial charge generation

Fig. 2

a Temperature dependence of JD at V = − 0.5 V for the four perovskite photodiodes. Open circles are experimental data, whiskers represent standard deviation. Linear fits according to JD exp(−Ea/kBT) are shown by dashed lines, standard errors are also reported. b Comparison between experimental activation energies Ea (bars with solid outline, whiskers are standard error) and energetic barriers (EC − EHOMO, bars with dashed outline, whiskers indicate the uncertainty of energy levels) for the different Pb:Sn compositions. c Schematic representation of the thermal charge generation mechanism at the EBL-perovskite interface. d Comparison between the statistical distribution of the experimental JD (open circles, with boxplots showing median (center line), 25th and 75th percentiles (box limits) and 5th and 95th percentiles (whiskers)) and the simulated dark current density (see Supplementary Fig. 9) resulting from interfacial generation for different values of Φ (squares) with uncertainty (gray area) at −0.5 V for Sn contents x = 0, 0.25, 0.40, and 0.50. Simulation details are presented in Supplementary Note 1.

Back to article page