Fig. 3: Effect of EHOMO of the EBL on dark current. | Nature Communications

Fig. 3: Effect of EHOMO of the EBL on dark current.

From: Ultralow dark current in near-infrared perovskite photodiodes by reducing charge injection and interfacial charge generation

Fig. 3

a HOMO levels of all electron blocking layers (EC, pvk represents the CBM of FA0.66MA0.34Pb0.5Sn0.5I3 perovskite). b Reverse dark current densities of PPDs with different EBLs (and FA0.66MA0.34Pb0.5Sn0.5I3 perovskite). JD is measured over time by applying a constant bias of −0.5 V. c Activation energy of JD, Ea, plotted vs. the energetic difference Φ = EC − EHOMO for different EBL-perovskite systems, as indicated by the legend. Vertical whiskers indicates the standard error in fitting Ea. d Experimental dark current density (measured at V = −0.5 V, room temperature) vs. Φ for the same combination of electron blocking layers and Pb:Sn compositions. In the interval plot, colored circles and whiskers are mean values and 95th percentile confidence interval, respectively. The horizontal whiskers in (c) and (d) represent the uncertainty of energy levels.

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