Fig. 3: Spatially resolved X-ray nanodiffraction experiment and average diffraction patterns.
a Scheme of the X-ray experiment. EIGER X 4 M 2D detector is positioned downstream from the sample. The arrows show the directions Δx and Δy of spatial scanning. Inset (top right): a SEM micrograph of the CsPbBr2Cl NC supercrystal. b Average diffraction pattern for a supercrystal. Several orders of WAXS and SAXS Bragg peaks from the atomic and supercrystal structure, respectively, are well visible. The WAXS Bragg peaks are indexed using pseudocubic notation. c Enlarged SAXS region of the averaged diffraction pattern. The Bragg peaks are indexed according to a simple cubic structure. d Diffraction map for a scan based on the integrated intensity of the SAXS diffraction patterns at q < 2 nm−1. The pixel size (the step size) is 500 nm.
