Fig. 5: Charge-noise spectrum.
From: Charge-noise spectroscopy of Si/SiGe quantum dots via dynamically-decoupled exchange oscillations
Plot of the single-sided charge-noise spectrum determined from a combination of FID, charge-sensor (CS), spin-echo (SE), and CPMG experiments. Data points around 60 Hz and multiples thereof have been omitted. A black trendline proportional to f−1 is shown. Spin-echo measurements are plotted at frequencies that maximize \(W(f;{T}_{2}^{e},{t}_{\pi },1)\). Gray vertical lines indicate the minimum resolvable frequency for the different values of NW. A blue line indicates the estimated white noise floor from the arbitrary waveform generator (AWG), which is approximately two orders of magnitude larger than the estimated Johnson–Nyquist noise from other resistors in our experimental setup.
