Fig. 3: X-Ray photoelectron spectroscopy.
From: Topotactic fluorination of intermetallics as an efficient route towards quantum materials
a XPS signals on the surface for LaFeSiFx (x = 0, 0.1, 0.3) single crystals, for the Si2s F1s, Fe2p3/2, and La3d5/2 core shells. The photoemission signals were acquired after several etching steps up to ~100 nm depth. b Secondary electron picture of the surface of a single-crystal LaFeSiF0.3 and corresponding La, Fe, Si, and F distribution maps for the same spot as determined by EDS analysis. The probed depth of the crystal is typically 1 µm.
