Fig. 1: Growth and structure.

a Schematic representation for the growth of imine-linked 2D COF films on SiO2/Si substrates. b AFM image of a 7-nm-thick PyTTA film prepared by thermal evaporation. The average roughness (Ra) is 1.96 nm. c–e AFM images of PyTTA-TPA COF films grown at different growth times. c 7 h, Ra = 1.53 nm. d 14 h, Ra = 0.97 nm, e 15 h, Ra = 0.73 nm, Scale bar 2 μm.