Fig. 1: Model OFETs with different film thicknesses and strains.

a Schematic diagram of the OFET with an optimal OSC film thickness. The penetration of gold nanoclusters into the semiconductor layer is shown. XRD diffraction peaks of the (001) crystal plane of DNTT b before and c after five years of storage. d Relative strain of DNTT films with different thicknesses before and after storage. e Schematic diagram of the OSC lattice under tensile and compressive strain.