Fig. 2: Hard X-ray nonresonant and soft X-ray resonant scattering from a polar vortex array.
From: Chiral structures of electric polarization vectors quantified by X-ray resonant scattering
a Reciprocal space map of (PbTiO3)n/(SrTiO3)n (n = 16 unit cells) superlattice around the (0 0 4)PC diffraction peak of the DyScO3 substrate using nonresonant hard X-rays. b Vertical line profiles corresponding to the truncation rod across the DyScO3 (0 0 4)PC peak and the qz rod scan across the lateral satellite peaks due to the periodicity of the polar vortex array formed in the PbTiO3 layer. c Scattering geometry. Angles \(\theta\) and \(\chi\) represent the incident angle and the sample tilt angle generating the lateral qx component, respectively. d REXS intensities of qz rod scans measured at the first-order satellites of opposite signs. The calculations show the effect of the vertical correlation length \({\xi }_{v}\) between PbTiO3 layers. e AT components of the basis Ti4+ ion obtained from XAS and XLD of a monodomain PbZr0.2Ti0.8O3 thin film measured by Arenholz et al.33. f, g Energy dependence of REXS intensities with right- and left-circularly polarized X-rays and their difference corresponding to X-ray circular dichroism. Intensities were measured at the lateral satellite-peak position (\({q}_{x}=0{{\mbox{.}}}057\)Å−1, \({q}_{z}=0{{\mbox{.}}}164{{\mbox{}}}\) Å−1). The calculations were obtained using the AT components in e.
