Fig. 3: Thin film characterization.
a AFM image of a decacyclene film transfered unto a Si/SiO2 wafer (For additional images see SI Fig. S5). b Height profile of the area marked in blue in a, showing a film thickness of 2.5 ± 0.7 nm. c SEM image of a decacyclene film free-standing over 0.6 µm diameter apertures. Ruptured thin films are indicated by arrows. Insert shows a zoom on the same grid, illustrating minor film defects as dark regions. d SEM image of a near-defect free decacyclene film free-standing over a 2 μm aperture.
