Fig. 4: High-frequency beam steering.
From: Beam steering at the nanosecond time scale with an atomically thin reflector
a Oscillations of center-of-mass deflection (λ0 = 754.5 nm) induced by oscillating back gate voltage (offset, V0 = 0.7 V; amplitude, ΔV = 0.45 V; period, τ =2 s) and VTG = 0.64 V. b, c Fourier plane images collected at VBG =V0 + ΔV (b) and VBG = V0 − ΔV (c), as indicated by circles in a, after subtracting reflection at VBG = V0. An inverted telescope was used to shrink the beam to simplify the subsequent APD measurements. d Photon count oscillations measured with APD at τ = 10 μs, 100 ns, 5.6 ns, and 3.2 ns (top to bottom). Darker (lighter) shade curves show photon counts from left (right) side of Fourier plane, as indicated by the inset in the top panel. All curves are normalized to the corresponding contrast at τ = 10 μs.
