Fig. 1: High-resolution characterization of Gd2Zr2O7 and high-entropy fluorite oxide (HEFO, (Sm0.2Gd0.2Dy0.2Er0.2Yb0.2)2Zr2O7) with edge dislocations and strain distribution.
From: Ultra-dense dislocations stabilized in high entropy oxide ceramics
a High-resolution transmission electron microscope (HRTEM) graph of Gd2Zr2O7; b The inverse fast Fourier transform (IFFT) filtered image of Gd2Zr2O7 shows perfect periodicity without dislocations; c HRTEM graph of high-entropy fluorite oxide; d The inverse fast Fourier transform (FFT) filtered image of high-entropy fluorite oxides; e HRTEM graph of single edge dislocation; f Geometric Phase Analysis (GPA) mapping of a calculated by Digital Micrograph, showing an overall strain field at nanoscale. The color scale represents change in strain intensity from −10% (compressive) to 10% (tensile). The yellow and red squares mark the area around the dislocations.
