Fig. 2: Wide dynamic spectral range of the reflection band obtained by modulating the frequency of the applied electric field.
From: Dynamically actuated soft heliconical architecture via frequency of electric fields
a Polarizing optical microscope (POM) textures of the helicoidal superstructure and the electrically induced heliconical superstructure accompanied by different reflection colors when a fixed electric field strength (i.e., 0.52 V μm−1) with increasing frequency from 1.0 to 116.0 kHz. Orthogonal double-arrows means the crossed polarizers. The scale bar is 300 μm. b The corresponding reflection spectra of the POM textures when the electric field strength (i.e., 0.52 V μm−1) was constant. c Frequency-dependent central wavelength of the reflection bands at various electric field strengths (I) and the evolution under a direct change in temperature (THS) controlled with a hot stage from 298.35 to 299.85 K under fixed electric field strength and frequency (i.e., 0.52 V μm−1 and 1.0 kHz) (II). d Almost unchanged dielectric anisotropy Δε and the slight change in sample temperature (ΔT) of 1.50 K at 0.52 V μm−1 under increasing frequency from 1.0 to 116.0 kHz. ΔT was defined as T–T0, and the initial temperature T0 of the sample at 1.0 kHz was 298.35 K. e Infrared temperature measurement of the sample with increasing electric field frequency by a thermal imager. The sample was located in the center of the rectangular area. Source data are provided as a Source Data file.
