Fig. 1: Preparation and characterization of twisted bilayer MoS2 (TBLM).
From: Determining the interlayer shearing in twisted bilayer MoS2 by nanoindentation
a Schematic diagram of the preparation of TBLM. Here, the bottom layer MoS2 collapses over the holes, while the upper layer is suspended over the holes. b Optical image of a TBLM sample. The dashed lines represent the edges of upper and bottom MoS2 monolayers. c Atomic force microscope surface topology image of TBLM over a single hole. The white solid line is the height profile of the sample across the white dashed line. The variation of the height profile is 4.1 nm. d Clear Moiré patterns of TBLM at twist angles of 24° and 9° (inset) observed under annular dark-field scanning transmission electron microscopy. e Comparison of the Raman spectra of TBLM and monolayer MoS2. The increase in peak interval is illustrated by the two black dashed lines. The inset shows the vibrational modes of \({E}_{2{{{{{\rm{g}}}}}}}^{1}\) and A1g. f Twist-angle dependence of the peak interval in TBLM samples on a SiO2/Si substrate. The red dashed line indicates the peak interval between \({E}_{2{{{{{\rm{g}}}}}}}^{1}\) and A1g of monolayer MoS2.
