Fig. 4: ‘Reading’ of intrinsic conductive DWs.
From: Nonvolatile ferroelectric domain wall memory integrated on silicon
a Schematics of c-AFM measurement circuit. b I–V curves on and off the conductive DWs. c–e Identification of the intrinsic conductive DWs. Current signals from c-AFM test (c) and in-plane phase signals from LPFM test (d) are overlapped for comparison (e). Current amplitudes along the line sections drawn in c are shown in insets of c. Arrows represent the polarization orientations in d.
