Fig. 2: Physical characterization.

a FE-SEM image in the upper panel (Scale bar, 500 nm) and the EDS mapping in the lower panel of the BERO (Scale bar, 200 nm) b TEM image in the left panel (Scale bar, 200 nm), HR-TEM image in the middle panel (Scale bar, 2 nm) and the experimental (top) and simulated (bottom) SAED pattern in the right panel (Scale bar, 5/nm) of the BERO. c Rietveld refinement of X-ray diffraction (XRD) patterns of as-prepared BERO. d Raman spectra of the BERO samples under different temperature. e The Raman peak shift of F2g mode as a function of increasing temperature for BERO, BRO and ERO.