Fig. 4: LEFM measurement on van der Waals heterostructures. | Nature Communications

Fig. 4: LEFM measurement on van der Waals heterostructures.

From: Electronic gap characterization at mesoscopic scale via scanning probe microscopy under ambient conditions

Fig. 4

a AFM topography mapping of the MoSe2/WSe2 van der Waals heterostructure. Inset is the optical image of the same sample (scale bars: 2 μm). b The height profile along the white dashed line in (a). c The band edge profile of the heterostructure along the white dashed line. The band gaps at the corresponding positions in (b) are marked by the color-corresponding arrows, and the band edges are highlighted by the dashed blue line. d The representative vibration amplitude vs. external bias curves obtained on the spots marked by the color-corresponding arrows in (c). The band edges are labeled by the arrows.

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