Fig. 2: Transverse resistance, Rxy, (with arbitrary offsets for clarity) as a function of magnetic field.
From: Anomalous transverse resistance in the topological superconductor β-Bi2Pd
a Rxy at various temperatures for 50 nm Bi2Pd/YIG film. b Rxy for Bi2Pd/YIG films with different thicknesses (50 nm, 70 nm, 85 nm, 300 nm, respectively) in comparison with 50 nm β-Bi2Pd/Si and 38 nm Nb/YIG. In order to compare the results obtained from the samples with various Tc, the temperatures at which the measurements are conducted are selected so that Hc2 remains similar values for all the samples. The temperatures are: 7.0 K, 2.4 K, 2.0 K, 2.2 K, 2.3 K and 2.6 K for thin films Nb(38)/YIG, Bi2Pd(50)/Si, Bi2Pd(50)/YIG, Bi2Pd(70)/YIG, Bi2Pd(85)/YIG and Bi2Pd(300)/YIG, respectively. 10 μA d.c. current was applied in-plane. All the magnetic fields are applied perpendicular to the film plane. The dot-dashed lines correspond to the critical fields (Hc2).
