Fig. 4: Characterization of SVs in 545 silkworm genomes. | Nature Communications

Fig. 4: Characterization of SVs in 545 silkworm genomes.

From: High-resolution silkworm pan-genome provides genetic insights into artificial selection and ecological adaptation

Fig. 4

a SV count of insertions (INS), deletions (DEL), duplications (DUP), and inversions (INV) in each of the 545 genomes. The proportions of DUP and INV are too low to be observed in the graph. b Allele frequency of nrSVs from 545 samples. c Pan-SV and core-SV counts with additional genomes. d Distribution map of genetic variations in 1082 genomes. (i) Chromosomes. (ii) Gene density. (iii) SNP and (iv) Indel densities across 1082 genomes. (v) Non-redundant SVs density of 545 TGS genomes. (vi) Density of non-redundant SVs of 537 NGS-only genomes. (vii) TE density. e Components of transposable elements (TEs) in sequences of insertion (INS), deletion (DEL), inversion (INV), and duplication (DUP). f Correlations of TGS-SV and TE counts. TGS-SV and TE numbers were counted in uninterrupted 500 kb windows. There is a significant linear relationship between the SV and TE distributions on chromosomes (Linear regression, R2 = 0.53, Pearson’s r = 0.7281, p = 3.426e-145, F test). Source data are provided as a Source Data file.

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