Fig. 2: SGBM in as-cast Mg-0.63 at.%Sn (3 wt.%) alloy.
From: Migration of solidification grain boundaries and prediction
a, b Optical micrographs showing large SGBM (arrows 1 and 2 in a) and localised small SGBM (arrows 1 and 2 in b). c A forescatter detector (FSD) image showing migrated SGBs and Sn-enriched interdendritic regions (bright). d EBSD inverse pole figure (IPF) map of c, showing different orientations of each grain at the triple junction in c, confirming the observed GB triple junction, where the dark regions are zero-solution regions, which cannot be indexed as Mg by the AZtec software due to Sn enrichment. e, f Energy dispersive spectroscopy (EDS) mapping of Sn and Mg in c, showing the enrichment of Sn (e) and depletion of Mg (f) in interdendritic regions. The unit for the colour scale is counts/s. g Backscattered electron (BSE) image showing migrated SGBs (yellow arrows), SGB particles (red arrows), Sn-enriched interdendritic regions (white arrows). h Eutectic α-Mg+Mg2Sn from a Sn-enriched interdendritic region in g.
