Fig. 2: Structural analysis and morphological characterization of Cu-HHTP films.
From: Electrically regulating nonlinear optical limiting of metal-organic framework film
a Structural models of Cu-HHTP along c-axis (top) and b-axis (down), H atoms are omitted for clarity. b The out-of- and in-plane XRD patterns of Cu-HHTP[001] and Cu-HHTP[100] films, and XRD pattern of Cu-HHTP powder in comparison to the simulated XRD pattern. c The surface, d cross-sectional SEM and e AFM images of Cu-HHTP[001] films. f The TEM and g, h HRTEM images of Cu-HHTP nanosheets scraped from the Cu-HHTP[001] film sample (inserted g: SAED pattern). arb. units: arbitrary units.
