Fig. 6: Pixel-by-pixel calibration of incident angle and calibration effect test.
From: Flexible hyperspectral surface plasmon resonance microscopy

a 2D distribution of RI sensitivity determined from the measured RW data in Fig. 5c. The x and y directions are perpendicular to and parallel to the SPW vector. b RI sensitivity at different pixels along the dotted lines in Fig. 6a. c Calibrated incident angles at different pixels along the dotted lines in Fig. 6a. d Spectral SPR image of the TiO2 ultrathin film in air. e and f 2D thickness distributions of the TiO2 ultrathin film calculated without and with calibration of incident angle. The similar results were obtained with four repeated measurements.