Fig. 6: Improved electron extraction and hole blocking at perovskite/C60 interface.

3D conductive-AFM images (5 × 5 μm) of the samples with a structure of ITO/MeO-2PACz/Pero/CB-NH2/ C60 (CB-NH2 treated) and ITO/MeO-2PACz/Pero/ C60 (control). The images represent a step-by-step applied voltage variation from −1.0 V applied to the tip (left) for hole extraction to 1.0 V applied to the tip (right) for electron extraction.