Fig. 2: Assessment of the Néel temperature \({T}_{{{{{{{{\rm{N}}}}}}}}}^{{{{{{{{\rm{top}}}}}}}}}\) at the top surface of Cr2O3 films.
From: Flexomagnetism and vertically graded Néel temperature of antiferromagnetic Cr2O3 thin films
a, b Transverse resistance \({R}_{{{{{{{{\rm{Tr}}}}}}}}}\) of the Pt electrode vs out-of-plane magnetic field at temperatures below (blue), in the vicinity of (green) and above (red) the phase transition to the paramagnetic state for the samples of different thicknesses. c Temperature dependence of the antiferromagnetic contribution from the Cr2O3 (Supplementary Note 5) is shown with symbols. The fit used to determine the Néel temperature at the top surface of the sample is shown with solid lines. d Top surface Néel temperature \({T}_{{{{{{{{\rm{N}}}}}}}}}^{{{{{{{{\rm{top}}}}}}}}}\) vs sample thickness. The Néel temperature measured on a single crystal is shown as well. Error bars arise from the smooth decay of the ∣R0(T)∣ to the noise level in the vicinity of antiferromagnet-paramagnet transition. e Temperature evolution of the antiferromagnetic contribution from the Cr2O3 taken right after sample fabrication (dashed lines) and after 18 months (solid lines).
