Fig. 3: Néel temperature of the interior of thin Cr2O3 films.
From: Flexomagnetism and vertically graded Néel temperature of antiferromagnetic Cr2O3 thin films
Temperature evolution of the antiferromagnetic domain pattern measured using NV magnetometry of (a) 100-nm-thick and (c) 50-nm-thick Cr2O3 samples. The strength of the measured stray fields decays upon approaching the transition temperature. Estimation of the phase transition temperature at the bottom interface, \({T}_{{{{{{{{\rm{N}}}}}}}}}^{{{{{{{{\rm{bot}}}}}}}}}\), of the (b) 100-nm-thick and (d) 50-nm-thick samples. The blue-shaded region in (b and d) corresponds to the uncertainty in the determination of the \({T}_{{{{{{{{\rm{N}}}}}}}}}^{{{{{{{{\rm{bot}}}}}}}}}\). The Néel temperature measured at the top surface via magnetotransport (Fig. 2) is shown for comparison in (b and d). A gray-shaded region indicates the uncertainty in the determination of the \({T}_{{{{{{{{\rm{N}}}}}}}}}^{{{{{{{{\rm{top}}}}}}}}}\). For the 50-nm-thick sample, a clear domain contrast is present even at temperature, which substantially higher than \({T}_{{{{{{{{\rm{N}}}}}}}}}^{{{{{{{{\rm{top}}}}}}}}}\). The strength of the stray field for scans shown in (a and c) are highlighted in (b and d) with corresponding symbols and error bars correspond to the half-width of the distribution.
