Fig. 1: Experimental setup of the HMES nanoscopy.
From: Hyperbolic material enhanced scattering nanoscopy for label-free super-resolution imaging
a–c Schematic of the HMES nanoscopy (a) and an enlarged view of it (b, c). An excitation laser beam (λ = 532 nm, p-polarized) was steered via scanning galvo mirrors through a 4f system, by which the polar angle, θ, and azimuthal angle, ϕ, of the incidence beam were defined. The scattered light from the object was passed through a diaphragm at back focal plane (BFP) and then collected by a sCMOS camera. d, e Scanning electron microscope (SEM) images of test objects, i.e., polystyrene beads (refractive index n = 1.6, radius r = 40 nm) in (d) and back scatterers, i.e., silver nanoparticles in (e). Scale bar: 200 nm.
