Fig. 3: Numerical simulation of the HMES nanoscopy.
From: Hyperbolic material enhanced scattering nanoscopy for label-free super-resolution imaging
a Partial scattering images of dielectric nanoparticles (radius r = 40 nm) with different oblique illumination angles, where the number of varied azimuthal angle of incidence m = 12, the number of varied polar angle of incidence n = 10. b The testing object. c A scattering image averaged over 120 images with coherent illumination from various directions. d Blind-SIM reconstructed image obtained from the 120 partial scattering images. Scale bars: 300 nm.
