Fig. 2: XPS measurements to study SEI evolution during virtual electrode plating at SE surface.

Evolution of core-level XPS spectra during the virtual electrode plating process at the LPSCl surface, at applied EBCs of 30 μA (or ~0.15 mA cm−2, left panel), 10 μA (or ~0.05 mA cm−2, central panel) and 2.5 μA (or ~0.01 mA cm−2, right panel), for a Li 1s, c S 2p and e P 2p transitions, as a function of the charge passed, qA (μAh cm−2). Quantification of XPS spectra plotted over varying amounts of charge passed at different current densities, depicting compositional fraction of b metallic Li (Li0) in Li 1s, d Li2S in S 2p, and f Li3P in P 2p. A larger fraction of Li0 (panel b) and Li3P (green area in panel f) for small amounts of charge passed at high current densities indicates faster reaction kinetics at the interface resulting in a quicker formation and growth of a metallic Li layer during plating.