Fig. 3: Scaling photolithography and probing of microgrid interface.

a Image of graphic encoded into a microgrid thin film using selective laser destabilization. b Photograph of an ambient-stable microgrid (40 µm) thin film after annealing. c Confocal fluorescence micrograph of a processed CsPbI₃ perovskite thin film (488 nm excitation/695–705 nm detection). A representative full PL spectrum is shown in the inset and acts as the color scale of the fluorescence image. d GIWAXS intensity of (200) γ-CsPbI₃ scattering planes measured with and without a microgrid, as a function of azimuthal angle (χ) in the q_z vs q_x,y image of reciprocal space. For simplicity, the missing wedge is overlooked (Supplementary Fig. 39) to better resolve the unique contributions arising from Texture 2, i.e. the inset illustrates the angle χ relative to the 2D x-ray detector. e Illustrations of the anisotropic origins of Textures 1 and 2.