Fig. 3: Mechanical characterization of carbon film cell substrate.
From: Morphological control enables nanometer-scale dissection of cell-cell signaling complexes
a Schematic of carbon square of EM grid being loaded in the center by the AFM probe. b Example of a single distance/force curve from loading one of the grid squares at a loading rate of 100 nm/s (red-approach). c The slopes of force/deformation curves (determined by a total least square regression) were used to calculate the spring constant associated with the carbon film across 100 nm/s (n = 6) and 1000 nm/s (n = 6). Each n represents a measurement from a separate grid square, Our results show no significant change between these loading rates. Error bars represent s.d., the centers mark the mean values. Statistical significance between the data sets was determined using a two-tailed Student’s t test assuming equal variance.
