Fig. 3: Microcavity electroreflectance at high SQ concentration.

Reflectivity and EA data for devices with a 40 wt% SQ:NPB active layer. a Angle-dependent s-polarized reflectivity spectra measured for a half-cavity control device (blue solid lines) together with corresponding transfer matrix simulations (red dashed lines) based on the associated optical constant dispersion in Fig. 1. Panels b and c show the measured and simulated electroreflectance spectra for this device; the simulation is produced by red-shifting and strengthening the Lorentz oscillators that model the SQ dispersion as described in the main text. d–f and g–i show analogous sets of reflectivity, measured, and simulated electroreflectance data for strongly-coupled microcavities with negative (\(\Delta=-120\) meV) and positive (\(\Delta=160\) meV) detuning, respectively. The green dashed lines in (d, g) indicate the energy of the bare exciton transition. In contrast to the experimental EA data in (e, h), the simulations predict a monotonic decrease in LP EA amplitude for the negatively-detuned cavity (f), and a much larger UP-relative-to-LP EA amplitude in the positively-detuned cavity (i).