Fig. 2: In-situ monitoring of intermediate phase, nucleation, and crystallization process of the control and FTPA based perovskite films during spin-coating and annealing procedures.

a In-situ tracking of X-ray diffraction of the perovskite films during three processes: wet perovskite film without (w/o) anti-solvent during spin-coating, wet perovskite film with (w) anti-solvent during spin-coating, and perovskite films annealed at 100 °C for various times. α and δ symbols indicated α-phase and δ-phase perovskite. b Optical microscopy images of the wet perovskite films without antisolvent during the spin-coating process. MA2Pb3I8·2DMSO film was prepared by perovskite of MAI/PbI2 (1:1 mol%) and δ-FAPbI3 was prepared by perovskite of FAI/PbI2 (1:1 mol%). c In-situ UV absorption spectra during the spin-coating process. d In-situ GIWAXS patterns during spin-coating process. e In-situ UV absorption spectra during the initial annealing process at 100 °C. f GIWAXS patterns of perovskite films after annealing 1 h.