Fig. 4: Stacking defects during film formation and in the working devices. | Nature Communications

Fig. 4: Stacking defects during film formation and in the working devices.

From: One-stone-for-two-birds strategy to attain beyond 25% perovskite solar cells

Fig. 4

a, b In situ PL spectra of films with or without 3API during spin coating and annealing. c, d The PL intensity extract from a and b. e, f PL intensity and photocurrents of the working devices with or without 3API. g, h The histogram of photocurrent statistics. Source data are provided as a Source Data file.

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