Fig. 2: Variation of the normalized X-ray diffraction intensities of the main \(10\bar{1}0\) peak of quartz (Qtz) and of the additional diffraction peaks of the high-pressure silica phase (Ros) at the approximate interplanar spacings of 4.2 (0001), 3.7 \((10\bar{1}0)\), 2.7 \((10\bar{1}1)\), and 1.7 Å \((10\bar{1}2)\). | Nature Communications

Fig. 2: Variation of the normalized X-ray diffraction intensities of the main \(10\bar{1}0\) peak of quartz (Qtz) and of the additional diffraction peaks of the high-pressure silica phase (Ros) at the approximate interplanar spacings of 4.2 (0001), 3.7 \((10\bar{1}0)\), 2.7 \((10\bar{1}1)\), and 1.7 Å \((10\bar{1}2)\).

From: Evidence for a rosiaite-structured high-pressure silica phase and its relation to lamellar amorphization in quartz

Fig. 2

The plot additionally shows the normalized sum of peak intensities for the high-pressure phase and the normalized diffuse background intensities, representing the glass fraction.

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