Fig. 3: Stacked relative X-ray diffraction intensities of backgrounds for various times (t) and pressures (P) during loading (80–200 s) and unloading (200–360 s). | Nature Communications

Fig. 3: Stacked relative X-ray diffraction intensities of backgrounds for various times (t) and pressures (P) during loading (80–200 s) and unloading (200–360 s).

From: Evidence for a rosiaite-structured high-pressure silica phase and its relation to lamellar amorphization in quartz

Fig. 3

The intensities display the difference of each background with respect to the reference background at 80 s. It is visible that the diffuse background intensity in the low 2θ region progressively increases due to the formation of amorphous material.

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