Fig. 2: Rietveld refinement of room-temperature XRD patterns for the studied materials. | Nature Communications

Fig. 2: Rietveld refinement of room-temperature XRD patterns for the studied materials.

From: Phase formation capability and compositional design of β-phase multiple rare-earth principal component disilicates

Fig. 2

a Results for the as-synthesized powders of (Dy0.25Ho0.25Yb0.25Lu0.25)2Si2O7 prepared at 1550 °C. b Results for the bulk sample of (Dy0.25Ho0.25Yb0.25Lu0.25)2Si2O7 fabricated via hot-pressing sintering method at 1650 °C. c Results for the as-synthesized powders of (Gd0.25Ho0.25Yb0.25Lu0.25)2Si2O7 prepared at 1550 °C. d Results for the as-synthesized powders of (Lax1Cex2Ybx3Lux4)2Si2O7 prepared at 1550 °C. e Results for the bulk sample of (Lax1Cex2Ybx3Lux4)2Si2O7 fabricated via hot-pressing sintering method at 1650 °C. The reliability factors Rp and Rwp are also presented in the figures. The short vertical lines in dark cyan, magenta and dark yellow color at the bottom of each panel denote the positions of XRD peaks of β-RE2Si2O7, γ-RE2Si2O7, and G-RE2Si2O7, respectively.

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