Fig. 5: In situ high-energy XRD characterization of antiferroelectric and relaxor states.
From: Tailoring high-energy storage NaNbO3-based materials from antiferroelectric to relaxor states
a Contour plots of representative primary and superlattice reflections of the NN5SS_1.0Mn sample under the application of a unipolar electric field of 18 kV mm−1 and b the NN9SS_1.0Mn sample under the application of a bipolar electric field of 18 kV mm−1. c Evolution of the {200} peak position for the NN5SS_1.0Mn sample and d the NN9SS_1.0Mn sample. e, f Pseudocubic lattice parameters and primitive cell volume of the NN5SS_1.0Mn sample as a function of the electric field, obtained from LeBail fitting using a single-phase model. aPC, bPC, and cPC are the lattice parameters of the primitive cell, and γ is the in-plane angle between the cell axes aPC and bPC (Supplementary Fig. 19).
