Fig. 4: Three sets of HAADF images for the premelted fault regions at different temperatures.
From: Atomic-scale observation of premelting at 2D lattice defects inside oxide crystals
a−c More than 10 grains in the [100] projection were observed in each case of post-annealing at 1400 (a), 1500 (b), and 1600 °C (c). It is noted that the thickness of the premelted amorphous layers is not completely constant at each annealing temperature but somewhat varies from fault to fault.
