Fig. 5: Thickness distributions of premelted amorphous layers.
From: Atomic-scale observation of premelting at 2D lattice defects inside oxide crystals
a−c These bar graphs present the thickness distribution of amorphous layers in samples post-annealed at 1400 (a), 1500 (b), and 1600 °C (c). The amorphous layers become thicker, as the annealing temperature increases from 1400 to 1600 °C. Frequently observed thicknesses of amorphous layers in each graph are represented as the thicknesses observed at more than 60% of grain boundaries.
