Fig. 4: Device performance and stability.

a J−V curves and photovoltaic parameters of champion devices of the control and NVP-based PSCs measured in-house. b Representative EQEs and integrated JSC values of the control and NVP-based PSCs. c J−V curves of a larger-area NVP-based PSC. The active area is 1.0 cm2, defined by a mask aperture. The inset is a photograph of the device with dotted outlines representing the active areas. d Normalized PCE of encapsulated PSCs according to ISOS-L-2 protocol (1-sun illumination and 65 °C, in N2 atmosphere). e Normalized PCE of encapsulated PSCs according to the ISOS-D-3 protocol (85% RH and 85 °C, in a damp-heat chamber). All error bars represent the standard deviation of six devices. f Screenshots of unencapsulated control and perovskite/NVP films in water steam test (100% RH and 100 °C) captured from Movie S1.